| Alternative NSN: 5962-01-642-8847 |
| Item Name: Microcircuit Assemb |
| CAGE Code : 1WDK8 |
| NIIN: 016428847 |
| FSC Name: 5962 Microcircuits Electronic |
| NCB Code: USA (01) |
| Manufacturers: silicon laboratories inc |
|
Part No Part No
|
Manufacturer |
Item Name Item Name
|
QTY QTY
|
RFQ RFQ
|
|---|---|---|---|---|
| C8051F130 | silicon laboratories inc | microcircuit assemb | Avl |
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAT | BODY WIDTH | 14.00 MILLIMETERS NOMINAL |
| ADAQ | BODY LENGTH | 14.00 MILLIMETERS NOMINAL |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | 100 MIPS,128 KB FLASH, 10-BIT ADC, MIXED SIGNAL MCU |
| ABMK | OVERALL WIDTH | 16.00 MILLIMETERS NOMINAL |
| ABHP | OVERALL LENGTH | 16.00 MILLIMETERS NOMINAL |
| ABKW | OVERALL HEIGHT | 1.20 MILLIMETERS MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -40.0 TO 85.0 DEG CELSIUS |
| CQSZ | INCLOSURE CONFIGURATION | QUAD-IN-LINE |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 3.6 VOLTS MAXIMUM TOTAL SUPPLY |
| CZER | MEMORY DEVICE TYPE | RAM |
| FEAT | SPECIAL FEATURES | 8 EXTERNAL PROGRAMMABLE INPUTS; PROGRAMMABLE AMPLIFIER GAIN; DATA DEPENDENT WINDOWED INTERRUPT GENERATOR; BUILT-IN TEMP SENSOR; 2 COMPARATORS; INTERNAL VOLTAGE REFERENCE; MONITOR/BROWN-OUT DETECTOR; ON-CHIP JTAG DEBUG AND BOUNDARY SCAN WHIC |
| TTQY | TERMINAL TYPE AND QUANTITY | 100 PIN |
| CZEM | MICROCIRCUIT DEVICE TYPE AND QUANTITY | 1 MEMORY |
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